Fault-tolerant self-timed serial-parallel port: variants of realization

The design of digital devices with both reliability and energy-efficiency is one of the important directions of information technologies development. The self-timed circuits have unique properties — width operation range, self-testing for stuck-at faults and energy-consumption decrease. The ability of self-test makes self-repair techniques better and more perspective for self-timed circuits. However, the fault-tolerance is necessary for some fields of application. The key difference between different techniques of reliability improvement is researched in this paper by the example of proposed technical solutions that realize most efficient designing methods. The usage of complex indices provides comparison of designs.