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Sistemy i Sredstva Informatiki [Systems and Means of Informatics], 2006, , Issue 16, Pages 486–495 (Mi ssi30)  
Архитектура, системные решения и программное обеспечение вычислительных комплексов и сетей новых поколений

System for self-timed integrated circuits testing

V. S. Petrukhin, Yu. A. Stepchenkov, N. V. Morozov, D. Yu. Stepchenkov
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Abstract: The article considers the main problems of coupling controlling and measuring apparatus with self-timed circuits. The structure of hardware–software testing system SATOK is presented. This system is used for comparative testing of synchronous and self-timed implementations of the functionally identical circuits. Detailed description of user interface for such testing is presented also.
Document Type: Article
UDC: 621.3.049.77+004.312
Language: Russian
Citation: V. S. Petrukhin, Yu. A. Stepchenkov, N. V. Morozov, D. Yu. Stepchenkov, “System for self-timed integrated circuits testing”, Sistemy i Sredstva Inform., 2006, no. 16, 486–495
Citation in format AMSBIB
\Bibitem{PetSteMor06}
\by V.~S.~Petrukhin, Yu.~A.~Stepchenkov, N.~V.~Morozov, D.~Yu.~Stepchenkov
\paper System for self-timed integrated circuits testing
\jour Sistemy i Sredstva Inform.
\yr 2006
\issue 16
\pages 486--495
\mathnet{http://mi.mathnet.ru/ssi30}
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  • https://www.mathnet.ru/eng/ssi/v16/i1/p486
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    		Системы и средства информатики
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