Self-timed electronic circuits analysis by functional method

The article describes functional method of self-timed electronic circuits analysis based on signals indications and designed for the first time ever. In contrast to event-based methods the functional one allows to get detailed information on indication of the internal and external circuit signals during one session and all circuit parameters at once. The method allows studying a wider fault class than before and opens the way for analysis of circuits practically of unlimited size. The method is characterized by polynomial complexity of calculations in number of circuit signals. On the basis of functional method there was created a program of self-timed analysis SAMAN.