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Sibirskii Matematicheskii Zhurnal, 1972, Volume 13, Number 5, Pages 1016–1029
(Mi smj4509)
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An investigation of the continuity of a technological mapping in the von Neumann–Gale model
I. A. Krass
Received: 22.10.1970
Citation:
I. A. Krass, “An investigation of the continuity of a technological mapping in the von Neumann–Gale model”, Sibirsk. Mat. Zh., 13:5 (1972), 1016–1029; Siberian Math. J., 13:5 (1972), 703–712
Linking options:
https://www.mathnet.ru/eng/smj4509 https://www.mathnet.ru/eng/smj/v13/i5/p1016
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Abstract page: | 54 | Full-text PDF : | 21 |
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