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Sibirskii Zhurnal Industrial'noi Matematiki, 2000, Volume 3, Number 1, Pages 110–115 (Mi sjim89)  
Local tomographical reconstruction of a thin defect envelope by using a standard pattern

S. M. Zerkal'
Full-text PDF (245 kB)
Received: 04.04.2000
Bibliographic databases:
UDC: 514.8+620.179.15
Language: Russian
Citation: S. M. Zerkal', “Local tomographical reconstruction of a thin defect envelope by using a standard pattern”, Sib. Zh. Ind. Mat., 3:1 (2000), 110–115
Citation in format AMSBIB
\Bibitem{Zer00}
\by S.~M.~Zerkal'
\paper Local tomographical reconstruction of a~thin defect envelope by using a~standard pattern
\jour Sib. Zh. Ind. Mat.
\yr 2000
\vol 3
\issue 1
\pages 110--115
\mathnet{http://mi.mathnet.ru/sjim89}
\zmath{https://zbmath.org/?q=an:0956.65118}
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  • https://www.mathnet.ru/eng/sjim/v3/i1/p110
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    		Сибирский журнал индустриальной математики
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