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Sibirskii Zhurnal Industrial'noi Matematiki, 2000, Volume 3, Number 1, Pages 110–115
(Mi sjim89)
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Local tomographical reconstruction of a thin defect envelope by using a standard pattern
S. M. Zerkal'
Received: 04.04.2000
Citation:
S. M. Zerkal', “Local tomographical reconstruction of a thin defect envelope by using a standard pattern”, Sib. Zh. Ind. Mat., 3:1 (2000), 110–115
Linking options:
https://www.mathnet.ru/eng/sjim89 https://www.mathnet.ru/eng/sjim/v3/i1/p110
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