Algorithm for controlling the process of spraying optical coatings based on sample broadband measurement data

An algorithm for controlling the deposition process of optical coatings based on the analysis of sample data of broadband measurements for a fixed set of wavelengths is considered. The considered algorithm uses broadband measurement data on the one hand, which is an advantage compared to using only monochromatic measurement data for one fixed wavelength, and on the other hand is fast-acting compared to algorithms using full broadband measurement data. It is demonstrated that the proposed algorithm makes it possible to obtain sufficiently accurate estimates of the thicknesses of layers of sprayed multilayer optical coatings.