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Sibirskie Èlektronnye Matematicheskie Izvestiya [Siberian Electronic Mathematical Reports], 2017, Volume 14, Pages 914–926
DOI: https://doi.org/10.17377/semi.2017.14.077 (Mi semr834) 		 
Computational mathematics

A numerical method for analyzing nonlocal data from film thermoresistors of electronic boards

V. V. Shaydurova, A. A. Korneevab

a Institute of Computational Modeling SB RAS, Akademgorodok, 50/44, 660036, Krasnoyarsk, Russia
b Siberian Federal University, 79 Svobodny pr., 660041, Krasnoyarsk, Russia
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DOI: https://doi.org/10.17377/semi.2017.14.077
Abstract: An algorithm is proposed for determining the areas of overheating of a printed circuit board with electronic components and the temperature of overheating by analyzing nonlocal data from extended film thermistors. The algorithm is based on the physical-mathematical model of the temperature field of the board, as well as some qualitative characteristics of thermal states under study, which compensate the underdefinition of the original mathematical formulation. The results of computational experiments illustrating the operability of the algorithm are presented.
Keywords: film thermoresistors, physical-mathematical model, underdefined systems of equations, numerical algorithms.
Funding agency Grant number
Russian Foundation for Basic Research 16-41-242104_р_офи_м
Received June 9, 2017, published September 15, 2017
Bibliographic databases:
Document Type: Article
UDC: 519.612 : 51-74
MSC: 15A03, 65F05
Language: Russian
Citation: V. V. Shaydurov, A. A. Korneeva, “A numerical method for analyzing nonlocal data from film thermoresistors of electronic boards”, Sib. Èlektron. Mat. Izv., 14 (2017), 914–926
Citation in format AMSBIB
\Bibitem{ShaKor17}
\by V.~V.~Shaydurov, A.~A.~Korneeva
\paper A numerical method for analyzing nonlocal data from film thermoresistors of electronic boards
\jour Sib. \`Elektron. Mat. Izv.
\yr 2017
\vol 14
\pages 914--926
\mathnet{http://mi.mathnet.ru/semr834}
\crossref{https://doi.org/10.17377/semi.2017.14.077}
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