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Russian Chemical Reviews, 1990, Volume 59, Issue 7, Pages 607–626
DOI: https://doi.org/10.1070/RC1990v059n07ABEH003572
(Mi rcr825)
 

This article is cited in 8 scientific papers (total in 8 papers)

Low-temperature X-ray diffraction analysis: possibilities in the solution of chemical problems

M. Yu. Antipin

A. N. Nesmeyanov Institute of Organoelement Compounds, USSR Academy of Sciences, Moscow
English full-text Citations (8)
Abstract: The possibilities of the modern precision X-ray diffraction method for the determination of the exact geometry, the characteristics of the thermal vibrations, and the distribution of electron density in the crystals of molecular compounds are examined in relation to a number of examples. The role of such investigations in the solution of chemical problems is demonstrated. The bibliography includes 134 references.
Russian version:
Uspekhi Khimii, 1990, Volume 59, Issue 7, Pages 1052–1084
DOI: https://doi.org/10.1070/RC1990v059n07ABEH003572
Bibliographic databases:
Document Type: Article
UDC: 548.737
Language: English
Original paper language: Russian


Citation: M. Yu. Antipin, “Low-temperature X-ray diffraction analysis: possibilities in the solution of chemical problems”, Usp. Khim., 59:7 (1990), 1052–1084; Russian Chem. Reviews, 59:7 (1990), 607–626
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  • https://doi.org/10.1070/RC1990v059n07ABEH003572
  • https://www.mathnet.ru/eng/rcr/v59/i7/p1052
  • This publication is cited in the following 8 articles:
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