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This article is cited in 8 scientific papers (total in 8 papers)
Low-temperature X-ray diffraction analysis: possibilities in the solution of chemical problems
M. Yu. Antipin A. N. Nesmeyanov Institute of Organoelement Compounds, USSR Academy of Sciences, Moscow
Abstract:
The possibilities of the modern precision X-ray diffraction method for the determination of the exact geometry, the characteristics of the thermal vibrations, and the distribution of electron density in the crystals of molecular compounds are examined in relation to a number of examples. The role of such investigations in the solution of chemical problems is demonstrated. The bibliography includes 134 references.
Citation:
M. Yu. Antipin, “Low-temperature X-ray diffraction analysis: possibilities in the solution of chemical problems”, Usp. Khim., 59:7 (1990), 1052–1084; Russian Chem. Reviews, 59:7 (1990), 607–626
Linking options:
https://www.mathnet.ru/eng/rcr825https://doi.org/10.1070/RC1990v059n07ABEH003572 https://www.mathnet.ru/eng/rcr/v59/i7/p1052
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