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Russian Chemical Reviews, 2006, Volume 75, Issue 1, Pages 23–30
DOI: https://doi.org/10.1070/RC2006v075n01ABEH003600
(Mi rcr322)
 

This article is cited in 13 scientific papers (total in 13 papers)

Atomic resolution probe microscopy of the graphite surface

O. V. Sinitsynaa, I. V. Yaminskiib

a Lomonosov Moscow State University, Faculty of Materials Science
b Lomonosov Moscow State University, Faculty of Physics
English full-text Citations (13)
Abstract: The results of theoretical and experimental studies of the graphite surface by scanning tunnelling and atomic force microscopy are considered. The attention is focused on the mechanisms of formation of atomic resolution images. The reasons for the lack of coincidence between the graphite surface images obtained by these methods and its real topography are discussed.
Received: 29.08.2005
Russian version:
Uspekhi Khimii, 2006, Volume 75, Issue 1, Pages 27–35
DOI: https://doi.org/10.1070/RC2006v075n01ABEH003600
Bibliographic databases:
Document Type: Article
Language: English
Original paper language: Russian


Citation: O. V. Sinitsyna, I. V. Yaminskii, “Atomic resolution probe microscopy of the graphite surface”, Usp. Khim., 75:1 (2006), 27–35; Russian Chem. Reviews, 75:1 (2006), 23–30
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  • https://www.mathnet.ru/eng/rcr322
  • https://doi.org/10.1070/RC2006v075n01ABEH003600
  • https://www.mathnet.ru/eng/rcr/v75/i1/p27
  • This publication is cited in the following 13 articles:
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