|
Brief Communications
Mechanism of enhancement of light scattering during optical recording in $As_2S_3$ films
A. A. Anikin, V. K. Malinovskii, A. A. Sokolov Institute of automation and Electrometry, Novosibirsk
Abstract:
An experimental study was made of the kinetics of light scattering during exposure of films $As_2S_3$ to monochromatic and white light. It was established that the experimentally observed considerable enhancement of light scattering was due to the coherence of light. Hie maximum enhancement depended on the initial degree of scattering and on the film thickness. The surface layer of a film acted as the source of the strong initial scattering in the case of films whose thickness exceeded 7 $\mu m$.
Received: 23.04.1979
Citation:
A. A. Anikin, V. K. Malinovskii, A. A. Sokolov, “Mechanism of enhancement of light scattering during optical recording in $As_2S_3$ films”, Kvantovaya Elektronika, 7:1 (1980), 179–181 [Sov J Quantum Electron, 10:1 (1980), 100–101]
Linking options:
https://www.mathnet.ru/eng/qe9865 https://www.mathnet.ru/eng/qe/v7/i1/p179
|
Statistics & downloads: |
Abstract page: | 136 | Full-text PDF : | 58 |
|