Kvantovaya Elektronika
RUS  ENG    JOURNALS   PEOPLE   ORGANISATIONS   CONFERENCES   SEMINARS   VIDEO LIBRARY   PACKAGE AMSBIB  
General information
Latest issue
Archive
Impact factor
Submit a manuscript

Search papers
Search references

RSS
Latest issue
Current issues
Archive issues
What is RSS



Kvantovaya Elektronika:
Year:
Volume:
Issue:
Page:
Find






Personal entry:
Login:
Password:
Save password
Enter
Forgotten password?
Register


Kvantovaya Elektronika, 1980, Volume 7, Number 1, Pages 105–109 (Mi qe9855)  

Investigation of nonlinear optical properties of thin absorbing films near the critical angle of total reflection

B. B. Boĭko, I. Z. Dzhilavdari, G. I. Olefir, N. S. Petrov, V. A. Chernyavskii

Institute of solid state physics and semiconductors of the Academy of Sciences of BSSR
Abstract: The results of an experimental investigation of the nonlinear optical properties of thin absorbing films (solutions of cobalt chloride in ethanol) are presented. The dependence of the reflectivity of an absorbing plane-parallel film on the energy density of the incident radiation was obtained for different thicknesses of the film and different angles of incidence. It was found that near the critical angle of total reflection, the reflection coefficient of thin (of the order of a few microns) absorbing films varied fairly widely (approximately between 0 and 1). This was due to the establishment of a thermal mechanism of nonlinearity of the refractive index in the thin film, combined with interference. Q-switched laser action was achieved using a thin plane-parallel absorbing film as the Q-switch. The pulse energy was 1-1.5 J with half-width durations of 140-30 nsec, respectively.
Received: 15.05.1979
English version:
Soviet Journal of Quantum Electronics, 1980, Volume 10, Issue 1, Pages 57–60
DOI: https://doi.org/10.1070/QE1980v010n01ABEH009855
Bibliographic databases:
UDC: 535.421
PACS: 78.65.Jd
Language: Russian
Citation: B. B. Boǐko, I. Z. Dzhilavdari, G. I. Olefir, N. S. Petrov, V. A. Chernyavskii, “Investigation of nonlinear optical properties of thin absorbing films near the critical angle of total reflection”, Kvantovaya Elektronika, 7:1 (1980), 105–109 [Sov J Quantum Electron, 10:1 (1980), 57–60]
Citation in format AMSBIB
\Bibitem{BokDzhOle80}
\by B.~B.~Bo{\v\i}ko, I.~Z.~Dzhilavdari, G.~I.~Olefir, N.~S.~Petrov, V.~A.~Chernyavskii
\paper Investigation of nonlinear optical properties of thin absorbing films near the critical angle of total reflection
\jour Kvantovaya Elektronika
\yr 1980
\vol 7
\issue 1
\pages 105--109
\mathnet{http://mi.mathnet.ru/qe9855}
\transl
\jour Sov J Quantum Electron
\yr 1980
\vol 10
\issue 1
\pages 57--60
\crossref{https://doi.org/10.1070/QE1980v010n01ABEH009855}
\isi{https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=Publons&SrcAuth=Publons_CEL&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=A1980JE08000012}
Linking options:
  • https://www.mathnet.ru/eng/qe9855
  • https://www.mathnet.ru/eng/qe/v7/i1/p105
  • Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    Квантовая электроника Quantum Electronics
     
      Contact us:
     Terms of Use  Registration to the website  Logotypes © Steklov Mathematical Institute RAS, 2024