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Kvantovaya Elektronika, 1980, Volume 7, Number 1, Pages 34–41 (Mi qe9844)  
Two-phase model of damage to absorbing films by high–power optical pulses

V. P. Veiko, A. I. Kaidanov, E. B. Yakovlev

Leningrad Institute of Precision Mechanics and Optics
Full-text PDF (1278 kB)
Abstract: A quantitative two-phase model is developed to analyze the contribution made by the mechanism of displacement of the melt to the damage to thin absorbing films. This contribution is considered as a function of the main characteristics of the process which are the radiation parameters, properties of the film and substrate materials and their adhesion, surface tension and viscosity of the film, and also thermophysical and optical properties, thickness of the film, and size of the exposed area.
Received: 31.01.1979
English version:
Soviet Journal of Quantum Electronics, 1980, Volume 10, Issue 1, Pages 17–21
DOI: https://doi.org/10.1070/QE1980v010n01ABEH009844
Bibliographic databases:
UDC: 621.38
PACS: 68.60.+q, 61.80.-x, 42.60.He
Language: Russian
Citation: V. P. Veiko, A. I. Kaidanov, E. B. Yakovlev, “Two-phase model of damage to absorbing films by high–power optical pulses”, Kvantovaya Elektronika, 7:1 (1980), 34–41 [Sov J Quantum Electron, 10:1 (1980), 17–21]
Citation in format AMSBIB
\Bibitem{VeiKaiYak80}
\by V.~P.~Veiko, A.~I.~Kaidanov, E.~B.~Yakovlev
\paper Two-phase model of damage to absorbing films by high–power optical pulses
\jour Kvantovaya Elektronika
\yr 1980
\vol 7
\issue 1
\pages 34--41
\mathnet{http://mi.mathnet.ru/qe9844}
\transl
\jour Sov J Quantum Electron
\yr 1980
\vol 10
\issue 1
\pages 17--21
\crossref{https://doi.org/10.1070/QE1980v010n01ABEH009844}
\isi{https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=Publons&SrcAuth=Publons_CEL&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=A1980JE08000002}
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    		Квантовая электроника Quantum Electronics
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