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Brief Communications
Infrared laser defectograph
E. A. Vinogradov, V. A. Golovchinov, V. B. Dorofeeva, V. I. Zabelyshenskiĭ, N. A. Irisova, O. I. Kamorin, N. V. Mitrofanova, Yu. P. Timofeev, S. A. Fridman
Abstract:
A description is given of an infrared laser defectograph (flaw detector) based on the use of improved temperature sensitive luminescent screens which make visible the CO2 infrared laser radiation transmitted by an investigated object. This defectograph can be used to study the internal structure and microdefects in semiconducting materials which are opaque to visible light.
Received: 10.09.1976
Citation:
E. A. Vinogradov, V. A. Golovchinov, V. B. Dorofeeva, V. I. Zabelyshenskiĭ, N. A. Irisova, O. I. Kamorin, N. V. Mitrofanova, Yu. P. Timofeev, S. A. Fridman, “Infrared laser defectograph”, Kvantovaya Elektronika, 4:4 (1977), 914–916 [Sov J Quantum Electron, 7:4 (1977), 515–516]
Linking options:
https://www.mathnet.ru/eng/qe9783 https://www.mathnet.ru/eng/qe/v4/i4/p914
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| Abstract page: | 133 | | Full-text PDF : | 57 |
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