Scanning optical microscope based on an electron-beampumped semiconductor laser

A scanning optical microscope, based on a kamebax electron-probe unit, is described. The laser beam is scanned by deflection of the electron probe. The laser is made of a cadmium sulfide single crystal. The microscope can produce images in reflected, transmitted, or scattered light at various scanning rates, including those used in television. The resolution is estimated to be 1 μ. A magnification of 100–1000 can be covered without a change of the objective. Induced-current operation is also possible.