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Kvantovaya Elektronika, 1979, Volume 6, Number 5, Pages 1100–1102 (Mi qe9081)  

Brief Communications

Measurement of the absorption and thickness of an equivalent adsorbed water layer on an NaCl surface

V. I. Kovalev, F. S. Faĭzullov
Abstract: Measurements were made of the absorption at λ = 10.6 μ by an NaCl surface treated by various methods and also by a cleaved surface, using a calorimetric technique. It was found that the surface absorption may be attributed to the presence of water adsorbed in the fissured surface layer. The thickness of the equivalent adsorbed water layer was estimated from the absorption coefficient of water at λ = 10.6 μ.
Received: 05.10.1978
English version:
Soviet Journal of Quantum Electronics, 1979, Volume 9, Issue 5, Pages 649–651
DOI: https://doi.org/10.1070/QE1979v009n05ABEH009081
Document Type: Article
UDC: 621.3.038.825.2:620.193.2:535.34
PACS: 78.30.Gt, 68.45.By
Language: Russian


Citation: V. I. Kovalev, F. S. Faĭzullov, “Measurement of the absorption and thickness of an equivalent adsorbed water layer on an NaCl surface”, Kvantovaya Elektronika, 6:5 (1979), 1100–1102 [Sov J Quantum Electron, 9:5 (1979), 649–651]
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    Квантовая электроника Quantum Electronics
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