Intra-Doppler resonances of the cesium D2 line in a selective specular reflection profile

An investigation was made of selective specular reflection from ¹³³Cs vapor in the range of atomic concentrations between 4×10¹³ and 2×10¹⁵ cm^–3 where collisional broadening of the D₂ line is less than the Doppler broadening. The radiation source was an injection laser. Intra-Doppler resonances corresponding to the hyperfine structure of the excited state were recorded in the selective reflection profile. Shifts of the reflection resonances relative to the luminescence resonances of the atomic beam did not exceed 50 MHz. The possiblity of using selective reflection for linear spectroscopy of atomic lines without Doppler broadening is discussed.