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This article is cited in 4 scientific papers (total in 4 papers)
Brief Communications
Changes in the diffraction efficiency of grating structures formed in thin films of glassy chalcogenide semiconductors by neutron irradiation
A. M. Andriesh, V. P. Zhornik, A. V. Mironos, A. S. Smirnova
Abstract:
A study was made of the influence of sufficiently large neutron doses on the properties of diffraction grating structures formed in thin films of glassy chalcogenide semiconductors of the As–S system. The changes in the diffraction efficiency and in the sensitivity of the material depended strongly on the film composition. A method was found for increasing considerably the diffraction efficiency and sensitivity of some compositions by irradiation.
Received: 26.11.1984
Citation:
A. M. Andriesh, V. P. Zhornik, A. V. Mironos, A. S. Smirnova, “Changes in the diffraction efficiency of grating structures formed in thin films of glassy chalcogenide semiconductors by neutron irradiation”, Kvantovaya Elektronika, 12:9 (1985), 1948–1951 [Sov J Quantum Electron, 15:9 (1985), 1284–1287]
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https://www.mathnet.ru/eng/qe7740 https://www.mathnet.ru/eng/qe/v12/i9/p1948
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Abstract page: | 146 | Full-text PDF : | 78 | First page: | 1 |
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