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Kvantovaya Elektronika, 1985, Volume 12, Number 8, Pages 1755–1757 (Mi qe7630)  

Brief Communications

Angular dependence of the damage threshold of thin metal films

S. V. Kondrashov, N. F. Pilipetskiĭ, S. Yu. Savanin, V. V. Shkunov
Abstract: An experimental investigation was made of the angular dependence of the laser damage threshold of thin metal films. It was found that in the case of the p polarization of the incident radiation there was a considerable reduction in the damage threshold of silver, copper, and aluminum films when the angles of incidence corresponded to efficient excitation of surface polaritons.
Received: 05.11.1984
English version:
Soviet Journal of Quantum Electronics, 1985, Volume 15, Issue 8, Pages 1162–1163
DOI: https://doi.org/10.1070/QE1985v015n08ABEH007630
Bibliographic databases:
Document Type: Article
UDC: 621.337.826
PACS: 61.80.Ba, 71.36.+c, 73.20.Mf, 79.20.Ds
Language: Russian


Citation: S. V. Kondrashov, N. F. Pilipetskiĭ, S. Yu. Savanin, V. V. Shkunov, “Angular dependence of the damage threshold of thin metal films”, Kvantovaya Elektronika, 12:8 (1985), 1755–1757 [Sov J Quantum Electron, 15:8 (1985), 1162–1163]
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    Квантовая электроника Quantum Electronics
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