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Kvantovaya Elektronika, 1981, Volume 8, Number 5, Pages 1106–1108 (Mi qe6961)  

Brief Communications

Investigation of microdamage to dielectric coatings by laser radiation

M. B. Svechnikov, L. S. Vakhmyanina
Abstract: An experimental investigation was made of the behavior of microdefects in refractory oxide and sulfide-fluoride dielectric coatings in the prethreshold range of exposure to laser radiation. The results obtained demonstrated clearly that the centers of optical breakdown in ZnS and SrF2 (or MgF2) coatings were strongly absorbing microinhomogeneities, whereas in coatings made of ZrO2 and SiO2 neither the concentration of microinhomogeneities (of > 1 μ size) nor their dimensions were affected by the action of a pulse (or a series of pulses) of power density just below the threshold.
Received: 30.12.1980
English version:
Soviet Journal of Quantum Electronics, 1981, Volume 11, Issue 5, Pages 658–659
DOI: https://doi.org/10.1070/QE1981v011n05ABEH006961
Bibliographic databases:
Document Type: Article
UDC: 621.373.826
PACS: 42.78.Hk, 61.80.-x, 42.60.He
Language: Russian


Citation: M. B. Svechnikov, L. S. Vakhmyanina, “Investigation of microdamage to dielectric coatings by laser radiation”, Kvantovaya Elektronika, 8:5 (1981), 1106–1108 [Sov J Quantum Electron, 11:5 (1981), 658–659]
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    Квантовая электроника Quantum Electronics
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