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Kvantovaya Elektronika, 1987, Volume 14, Number 1, Pages 106–112 (Mi qe6424)  

This article is cited in 3 scientific papers (total in 3 papers)

Influence of radiation focusing and of surface finish of the optical system on the measurement of optical breakdown thresholds

V. G. Borodin, L. B. Glebov, O. M. Efimov, V. M. Migel', L. I. Migel', G. T. Petrovskii, Yu. D. Pimenov
Abstract: It was found that when laser radiation is focused into a spot having a size of the order of several wavelengths a strong dependence is observed of the threshold power required for the breakdown of transparent dielectrics on the focusing depth in a sample. This dependence can have different forms and is determined by the aberrations of the entire optical path, including the resonator mirrors and the sample under test. The absolute values of the threshold power density can be found by measuring the size of the central maximum in the focal region inside the sample and the fraction of the energy concentrated in it. The threshold radiation power density is then independent of the focusing depth in the sample.
Received: 03.12.1985
English version:
Soviet Journal of Quantum Electronics, 1987, Volume 17, Issue 1, Pages 60–64
DOI: https://doi.org/10.1070/QE1987v017n01ABEH006424
Bibliographic databases:
Document Type: Article
UDC: 535.212:621.373.826:666.22
PACS: 42.60.Jf, 52.80.-s, 42.15.Fr, 42.60.Da, 81.65.Ps
Language: Russian


Citation: V. G. Borodin, L. B. Glebov, O. M. Efimov, V. M. Migel', L. I. Migel', G. T. Petrovskii, Yu. D. Pimenov, “Influence of radiation focusing and of surface finish of the optical system on the measurement of optical breakdown thresholds”, Kvantovaya Elektronika, 14:1 (1987), 106–112 [Sov J Quantum Electron, 17:1 (1987), 60–64]
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  • https://www.mathnet.ru/eng/qe/v14/i1/p106
  • This publication is cited in the following 3 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    Квантовая электроника Quantum Electronics
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