Fabrication and investigation of thin-film CdSxSe1–x waveguides

The diffusion method was used to fabricate CdS_xSe_1–x solid-solution waveguides with losses in the range 9–13 dB/cm. The refractive index profile of these waveguides was determined. Photochemical etching of the waveguide surface was employed to form diffraction gratings with 10³ lines/mm and a relief 40-nm deep.