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Kvantovaya Elektronika, 1982, Volume 9, Number 11, Pages 2140–2150 (Mi qe6081)  

Analysis of factors influencing the threshold current of Pb1–xSnxSe injection heterolasers

L. P. Bychkova, O. I. Davarashvili, P. G. Eliseev, M. I. Saginuri, R. I. Chikovani, A. P. Shotov
Abstract: An analysis is made of the factors which influence the threshold current in PbSe/Pb1–xSnxSe injection heterolasers. These factors include the waveguide structure, electron confinement, inhomogeneity of the distribution of the gain across the thickness, nonradiative recombination at the heterojunctions and in the bulk, and temperature. The conditions are identified under which anomalies can be expected in the temperature dependence of the threshold current because of the influence of free carriers on the refractive index. The results agree with the experimental values of the threshold current density for a surface recombination velocity of ~2×105 cm/sec and an internal quantum efficiency of ≤ 0.1.
Received: 06.09.1981
Revised: 16.11.1981
English version:
Soviet Journal of Quantum Electronics, 1982, Volume 12, Issue 11, Pages 1391–1397
DOI: https://doi.org/10.1070/QE1982v012n11ABEH006081
Bibliographic databases:
Document Type: Article
UDC: 621.373.826.038.825.4
PACS: 42.55.Px
Language: Russian


Citation: L. P. Bychkova, O. I. Davarashvili, P. G. Eliseev, M. I. Saginuri, R. I. Chikovani, A. P. Shotov, “Analysis of factors influencing the threshold current of Pb1–xSnxSe injection heterolasers”, Kvantovaya Elektronika, 9:11 (1982), 2140–2150 [Sov J Quantum Electron, 12:11 (1982), 1391–1397]
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    Квантовая электроника Quantum Electronics
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