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This article is cited in 2 scientific papers (total in 2 papers)
Laser applications and other topics in quantum electronics
Surface roughness meter for the range 1–25 nm based on the scattered-light indicatrix
S. A. Abrosimov, M. V. Vysogorets, A. A. Malyutin, A. V. Nenashev, R. V. Serov General Physics Institute, Russian Academy of Sciences, Moscow
Abstract:
A description is given of an instrument for measuring the surface roughness, based on determination of the scattering indicatrix of laser radiation and characterised by a dynamic range corresponding to the intensity ratio 106. The capabilities of this instrument were demonstrated by measurements on special roughness test objects, diamond-turned mirrors, and high-quality polished metal surfaces.
Received: 09.04.1993
Citation:
S. A. Abrosimov, M. V. Vysogorets, A. A. Malyutin, A. V. Nenashev, R. V. Serov, “Surface roughness meter for the range 1–25 nm based on the scattered-light indicatrix”, Kvantovaya Elektronika, 21:1 (1994), 78–80 [Quantum Electron., 24:1 (1994), 75–77]
Linking options:
https://www.mathnet.ru/eng/qe6 https://www.mathnet.ru/eng/qe/v21/i1/p78
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