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Kvantovaya Elektronika, 1994, Volume 21, Number 1, Pages 78–80 (Mi qe6)  

This article is cited in 2 scientific papers (total in 2 papers)

Laser applications and other topics in quantum electronics

Surface roughness meter for the range 1–25 nm based on the scattered-light indicatrix

S. A. Abrosimov, M. V. Vysogorets, A. A. Malyutin, A. V. Nenashev, R. V. Serov

General Physics Institute, Russian Academy of Sciences, Moscow
Full-text PDF (165 kB) Citations (2)
Abstract: A description is given of an instrument for measuring the surface roughness, based on determination of the scattering indicatrix of laser radiation and characterised by a dynamic range corresponding to the intensity ratio 106. The capabilities of this instrument were demonstrated by measurements on special roughness test objects, diamond-turned mirrors, and high-quality polished metal surfaces.
Received: 09.04.1993
English version:
Quantum Electronics, 1994, Volume 24, Issue 1, Pages 75–77
DOI: https://doi.org/10.1070/QE1994v024n01ABEH000006
Bibliographic databases:
Document Type: Article
UDC: 535.36
PACS: 68.35.Dv
Language: Russian


Citation: S. A. Abrosimov, M. V. Vysogorets, A. A. Malyutin, A. V. Nenashev, R. V. Serov, “Surface roughness meter for the range 1–25 nm based on the scattered-light indicatrix”, Kvantovaya Elektronika, 21:1 (1994), 78–80 [Quantum Electron., 24:1 (1994), 75–77]
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  • https://www.mathnet.ru/eng/qe/v21/i1/p78
  • This publication is cited in the following 2 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
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