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Kvantovaya Elektronika, 1983, Volume 10, Number 10, Pages 2118–2120 (Mi qe4938)  

This article is cited in 2 scientific papers (total in 2 papers)

Brief Communications

Accelerated service life tests on injection lasers and transmitter modules

P. G. Eliseev, A. A. Kochetkov
Full-text PDF (495 kB) Citations (2)
Abstract: An analysis is made of the possibility of estimating reliably the service life of injection lasers from the results of accelerated tests carried out at elevated temperatures. An expression is obtained for the test acceleration coefficient under the following assumptions: the distribution of the initial parameters of the investigated lasers is described by the normal law; the distribution of failures under test is described by the logarithmic-normal law; the influence of temperature may be described by a thermally activated dependence. The efficiency of screening tests for the rejection of potentially unreliable samples is discussed and the possibility of finding an informative parameter suitable for the forecasting of service life is considered. The results obtained can be applied to accelerated service life tests on transmitter molecules.
Received: 16.12.1982
Revised: 22.03.1983
English version:
Soviet Journal of Quantum Electronics, 1983, Volume 13, Issue 10, Pages 1415–1417
DOI: https://doi.org/10.1070/QE1983v013n10ABEH004938
Bibliographic databases:
Document Type: Article
UDC: 621.378.35
PACS: 42.55.Px, 42.85.Fe
Language: Russian


Citation: P. G. Eliseev, A. A. Kochetkov, “Accelerated service life tests on injection lasers and transmitter modules”, Kvantovaya Elektronika, 10:10 (1983), 2118–2120 [Sov J Quantum Electron, 13:10 (1983), 1415–1417]
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  • https://www.mathnet.ru/eng/qe4938
  • https://www.mathnet.ru/eng/qe/v10/i10/p2118
  • This publication is cited in the following 2 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    Квантовая электроника Quantum Electronics
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