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Kvantovaya Elektronika, 1972, Number 3(9), Pages 105–106 (Mi qe4446)  

Brief Communications

Empirical estimation of the service life of injection lasers from short-term tests

P. G. Eliseev, I. Z. Pinsker, Yu. F. Fedorov
Abstract: It is shown that an effective method for selecting long-life injection lasers can be based on the initial rate of rise of the threshold current. This gives better results than the selection in accordance with the initial parameters. The aging mechanism is assumed to consist of the formation of new nonradiative recombination centers in the process of recombination of excess carriers.
Received: 18.11.1971
English version:
Soviet Journal of Quantum Electronics, 1972, Volume 2, Issue 3, Pages 290–291
DOI: https://doi.org/10.1070/QE1972v002n03ABEH004446
Document Type: Article
UDC: 621.378.35
PACS: 42.55.Px, 42.60.Lh, 42.60.Jf
Language: Russian


Citation: P. G. Eliseev, I. Z. Pinsker, Yu. F. Fedorov, “Empirical estimation of the service life of injection lasers from short-term tests”, Kvantovaya Elektronika, 3 (1972), 105–106 [Sov J Quantum Electron, 2:3 (1972), 290–291]
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