Screening action of a crater in local and layer-by-layer analysis in a mass spectrograph with a laser-plasma ion source

It is shown that materials with different physical properties are characterized by different widths of the linear part of the dependence of the charge reaching the slit of a mass-spectrograph monitor on the number of laser pulses. This difference and the change in the ratio of singly and doubly charged ions in the analytic part of a mass spectrograph are determined by the shape of the craters formed as a result of the interaction of laser radiation with the investigated material.