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Kvantovaya Elektronika, 2004, Volume 34, Number 3, Pages 294–295 (Mi qe2630)  

This article is cited in 3 scientific papers (total in 3 papers)

Laser applications and other topics in quantum electronics

Use of reflection dynamic gratings for studying films and absorbing media

E. V. Ivakin, M. Ganjali, A. V. Sukhodolov, V. V. Filippov

B. I. Stepanov Institute of Physics, National Academy of Sciences of Belarus, Minsk
Full-text PDF (144 kB) Citations (3)
Abstract: Experimental studies are performed which demonstrate the use of dynamic gratings in a thin surface layer for investigations of the properties of solids strongly absorbing light. Methods are proposed for measuring the temperature conductivity χ of a gas adjacent to a surface and of a thin transparent film on the absorbing surface. The optical measurements of χ for porous silicon films on a substrate are performed.
Received: 07.08.2003
English version:
Quantum Electronics, 2004, Volume 34, Issue 3, Pages 294–298
DOI: https://doi.org/10.1070/QE2004v034n03ABEH002630
Bibliographic databases:
Document Type: Article
PACS: 42.40.Eq, 78.20.Hp
Language: Russian


Citation: E. V. Ivakin, M. Ganjali, A. V. Sukhodolov, V. V. Filippov, “Use of reflection dynamic gratings for studying films and absorbing media”, Kvantovaya Elektronika, 34:3 (2004), 294–295 [Quantum Electron., 34:3 (2004), 294–298]
Linking options:
  • https://www.mathnet.ru/eng/qe2630
  • https://www.mathnet.ru/eng/qe/v34/i3/p294
  • This publication is cited in the following 3 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
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