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This article is cited in 9 scientific papers (total in 9 papers)
Holographic technologies (selection of papers from the HOLOEXRO 2019 conference)
Phase-shift speckle-shearing interferometry
G. N. Vishnyakovab, A. D. Ivanova, G. G. Levina, V. L. Minaeva a The All Russian Scientific-Research Institute for Optic Physical Metrology of Government Standard, Moscow
b Bauman Moscow State Technical University
Abstract:
We have numerically simulated the process of measuring stress – strain states by the method of speckle-shearing interferometry using the phase-shift technique. A computer model with the possibility of setting its strain and roughness is developed, which includes a model of a diffusely reflecting test object corresponding to the characteristics of a real membrane, as well as a speckle interferometer model that allows speckle interferograms to be obtained for different speckle sizes and angles between interfering beams. The process of reconstructing the object surface topogram from model speckle interferograms by the phase-shift technique is implemented. Using the developed models, a two-dimensional shearogram are obtained, which is a derivative of the strain field of a circular membrane. Comparison of the results of numerical simulation with experimental data shows that the differences (rms deviations) do not exceed 0.02 μm. It is also shown that the error of interferogram reconstruction by the phase-shift technique increases significantly when the test object strains exceed 12 μm.
Keywords:
speckle interferometry, schearography, phase-shift technique, stress – strain states, simulation.
Received: 18.02.2020 Revised: 29.03.2020
Citation:
G. N. Vishnyakov, A. D. Ivanov, G. G. Levin, V. L. Minaev, “Phase-shift speckle-shearing interferometry”, Kvantovaya Elektronika, 50:7 (2020), 636–642 [Quantum Electron., 50:7 (2020), 636–642]
Linking options:
https://www.mathnet.ru/eng/qe17281 https://www.mathnet.ru/eng/qe/v50/i7/p636
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