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This article is cited in 9 scientific papers (total in 9 papers)
Invited paper
Aperiodic reflection diffraction gratings for soft X-ray radiation and their application
E. A. Vishnyakova, A. O. Kolesnikovab, A. S. Pirozhkovc, E. N. Ragozina, A. N. Shatokhinab a P. N. Lebedev Physical Institute of the Russian Academy of Sciences, Moscow
b Moscow Institute of Physics and Technology (State University), Dolgoprudny, Moscow region
c Kansai Photon Science Institute, National Institutes for Quantum and Radiological Science and Technology, Japan
Abstract:
We briefly review the works concerned with the development and experimental use of the spectral instruments based on aperiodic reflection gratings whose spacing varies monotonically across the aperture according to a prescribed law (VLS gratings). The review considers the employment of VLS-grating instruments intended for the spectroscopy of laboratory and astrophysical plasmas, including the diagnostics of relativistic laser plasmas, for measuring X-ray laser linewidths, for recording the high-order harmonics of laser radiation, the radiation of fast electric discharges and other laboratory X-ray sources, as well as in reflectometry, X-ray fluorescence analysis and microscopy with the use of synchrotron radiation and laser-plasma radiation, and in emission spectroscopy combined with an electron microscope. Also discussed are achievements in the recently undertaken design and development of special-purpose VLS spectrometers intended for the investigation of the electronic structure of different materials and molecules by the spectroscopic technique of resonant inelastic X-ray scattering of synchrotron radiation. We describe flat-field grazing-incidence spectrometers with concave VLS gratings, which are compatible with modern CCD detectors, as well as plane VLS gratings, which are the key elements of scanning high- and ultrahigh-resolution spectrometers/monochromators with a constant deviation angle and stigmatic (imaging) spectrometers, which are also compatible with CCD detectors.
Keywords:
soft X-ray/VUV radiation, VLS grating, flat-field spectrometer, stigmatic (imaging) spectrometer.
Received: 18.04.2018 Revised: 16.08.2018
Citation:
E. A. Vishnyakov, A. O. Kolesnikov, A. S. Pirozhkov, E. N. Ragozin, A. N. Shatokhin, “Aperiodic reflection diffraction gratings for soft X-ray radiation and their application”, Kvantovaya Elektronika, 48:10 (2018), 916–929 [Quantum Electron., 48:10 (2018), 916–929]
Linking options:
https://www.mathnet.ru/eng/qe16900 https://www.mathnet.ru/eng/qe/v48/i10/p916
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Abstract page: | 309 | Full-text PDF : | 250 | References: | 28 | First page: | 12 |
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