Reflective mode X-ray microscopy of inclined objects

We propose an optical configuration of a reflective mode X-ray microscope which operates by the reflection of radiation incident on an object at grazing incidence. Primary emphasis is placed on the image recording with minimal aberrations. Numerical simulations are used to estimate the spatial resolution and the field of view, and a comparison is made with the results of investigation of surface-modified objects with a reflective mode X-ray laser microscope operating at a wavelength of 13.9 nm.