Defectoscopy of ZnGeP2 single crystals using a strontium vapour laser

A modified method of optical defectoscopy of ZnGeP₂ single crystal plates using a strontium vapour laser (λ = 1.03 and 1.09 μm) is proposed based on shadow imaging of internal defects in plates cut parallel to the (100) plane. It is shown that the use of a strontium vapour laser with a wavelength of 6.45 μm makes it possible to study inhomogeneities in large-size ZnGeP₂ samples. The possibility of fabricating a projection defectoscope for monitoring breakdown development in ZnGeP₂ crystals is considered.