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Electron microscopy
Scanning photoelectron microscopy using a pointed capillary probe
B. N. Mironov, A. P. Cherkun, S. A. Aseev, S. V. Chekalin Institute of Spectroscopy, Russian Academy of Sciences, Troitsk, Moscow
Abstract:
The possibilities of a new type of scanning probe microscopy (SPM) for two different samples are experimentally demonstrated. The method is based on the use of a pointed capillary, which can simultaneously act as a 'classical' SPM probe and also as a controlled thin channel for transporting charged particles emitted by the surface to the detector. In the experiment, photoelectrons pass through a dielectric hollow cone probe with an aperture radius of 1 μm and detected by microchannel plates at different points of the investigated conducting surface irradiated by the second harmonic of a femtosecond Ti : sapphire laser. As a result, the sample's surface profile is visualised with a subwavelength spatial resolution. This method makes it possible to control spatially localised beams of electrons, ions, neutral atoms (molecules) and soft X-ray radiation, as well as opens a possibility for research in the field of nanoscale photodesorption of molecular ions.
Keywords:
femtosecond laser radiation, photoelectron microscopy, capillary probe.
Received: 27.02.2017
Citation:
B. N. Mironov, A. P. Cherkun, S. A. Aseev, S. V. Chekalin, “Scanning photoelectron microscopy using a pointed capillary probe”, Kvantovaya Elektronika, 47:8 (2017), 757–761 [Quantum Electron., 47:8 (2017), 757–761]
Linking options:
https://www.mathnet.ru/eng/qe16652 https://www.mathnet.ru/eng/qe/v47/i8/p757
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Statistics & downloads: |
Abstract page: | 177 | Full-text PDF : | 32 | References: | 17 | First page: | 12 |
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