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This article is cited in 11 scientific papers (total in 11 papers)
X-ray optics
Imaging diffraction VLS spectrometer for a wavelength range λ > 120 Å
E. A. Vishnyakova, A. O. Kolesnikovab, A. A. Kuzinbc, D. V. Negrovb, E. N. Ragozinab, P. V. Sasorovd, A. N. Shatokhinab a P. N. Lebedev Physical Institute, Russian Academy of Sciences, Moscow
b Moscow Institute of Physics and Technology (State University), Dolgoprudny, Moscow region
c Institute of Spectroscopy, Russian Academy of Sciences, Troitsk, Moscow
d Keldysh Institute of Applied Mathematics of Russian Academy of Sciences, Moscow
Abstract:
A broadband stigmatic (imaging) soft X-ray (λ > 120 Å) spectrometer is experimentally realised. The optical configuration of the spectrometer comprises a plane grazing-incidence reflection grating with a spacing varying across its aperture according to a preassigned law [a so-called varied line-space (VLS) grating] and a broadband spherical normal-incidence mirror with an aperiodic Mo/Si multilayer structure. The average plate scale amounts to ~5.5 Å mm-1. The radiation is recorded with a matrix CCD detector (2048 × 1024 pixels of size 13 μm). The line spectra of the multiply charged ions LiIII and FV–FVII excited in laser-produced plasma are recorded with a spatial resolution of ~26 μm and a spectral resolving power R ≈ 500 is experimentally demonstrated.
Keywords:
soft X-ray range, stigmatic (imaging) spectrometer, VLS grating, aperiodic multilayer mirror, laser-produced plasma.
Received: 28.11.2016
Citation:
E. A. Vishnyakov, A. O. Kolesnikov, A. A. Kuzin, D. V. Negrov, E. N. Ragozin, P. V. Sasorov, A. N. Shatokhin, “Imaging diffraction VLS spectrometer for a wavelength range λ > 120 Å”, Kvantovaya Elektronika, 47:1 (2017), 54–57 [Quantum Electron., 47:1 (2017), 54–57]
Linking options:
https://www.mathnet.ru/eng/qe16546 https://www.mathnet.ru/eng/qe/v47/i1/p54
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Abstract page: | 288 | Full-text PDF : | 58 | References: | 33 | First page: | 11 |
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