Kvantovaya Elektronika
RUS  ENG    JOURNALS   PEOPLE   ORGANISATIONS   CONFERENCES   SEMINARS   VIDEO LIBRARY   PACKAGE AMSBIB  
General information
Latest issue
Archive
Impact factor
Submit a manuscript

Search papers
Search references

RSS
Latest issue
Current issues
Archive issues
What is RSS



Kvantovaya Elektronika:
Year:
Volume:
Issue:
Page:
Find






Personal entry:
Login:
Password:
Save password
Enter
Forgotten password?
Register


Kvantovaya Elektronika, 2016, Volume 46, Number 10, Pages 953–960 (Mi qe16474)  

This article is cited in 13 scientific papers (total in 13 papers)

X-ray optics

Soft X-ray flat-field VLS spectrographs

E. A. Vishnyakova, A. O. Kolesnikovab, E. N. Ragozinab, A. N. Shatokhinab

a P. N. Lebedev Physical Institute, Russian Academy of Sciences, Moscow
b Moscow Institute of Physics and Technology (State University), Dolgoprudny, Moscow region
References:
Abstract: We have analysed the capabilities of flat-field spectrometers with concave VLS reflection gratings from the standpoint of spectral imaging in the soft X-ray range. Two types of such instruments are shown to exist: spectrographs with as flat as possible a portion of the focal surface (of Harada spectrograph type) and those with a nearly constant distance from the grating centre to the focal surface, which permits reaching a high spatial resolution with the use of a crossed focusing mirror (without a loss in spectral resolution). Three 0.25, 0.5, and 1.5-m long spectrographs of Harada type were calculated for operation in the ranges 90 – 250, 50 – 200, and 20 – 110 Å, respectively. We show that each of the calculated instruments may be converted to an instrument of the second type for operation in the second and fourth diffraction orders without significant changes in scheme geometry. In this case, the theoretical spatial resolution is equal to ~10 μm throughout the optimisation range.
Keywords: laser-produced plasma, soft X-ray radiation, spectral images, concave VLS gratings, flat-field spectrographs, spectral focal surface.
Funding agency Grant number
Russian Science Foundation 14-12-00506
Received: 29.03.2016
Revised: 04.07.2016
English version:
Quantum Electronics, 2016, Volume 46, Issue 10, Pages 953–960
DOI: https://doi.org/10.1070/QEL16106
Bibliographic databases:
Document Type: Article
Language: Russian


Citation: E. A. Vishnyakov, A. O. Kolesnikov, E. N. Ragozin, A. N. Shatokhin, “Soft X-ray flat-field VLS spectrographs”, Kvantovaya Elektronika, 46:10 (2016), 953–960 [Quantum Electron., 46:10 (2016), 953–960]
Linking options:
  • https://www.mathnet.ru/eng/qe16474
  • https://www.mathnet.ru/eng/qe/v46/i10/p953
  • This publication is cited in the following 13 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    Квантовая электроника Quantum Electronics
    Statistics & downloads:
    Abstract page:224
    Full-text PDF :79
    References:31
    First page:6
     
      Contact us:
     Terms of Use  Registration to the website  Logotypes © Steklov Mathematical Institute RAS, 2024