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This article is cited in 3 scientific papers (total in 3 papers)
Extreme light fields and their applications
Microscopy of photoionisation processes
S. A. Aseev, B. N. Mironov, V. G. Minogin, A. P. Cherkun, S. V. Chekalin Institute of Spectroscopy, Russian Academy of Sciences, Troitsk, Moscow
Abstract:
A method is demonstrated which combines the ionisation of free molecules by a sharply focused femtosecond laser beam and projection microscopy in a divergent electric field. The electric field is produced in vacuum between a metallic tip and a flat positionsensitive charged particle detector. The method enables investigation of photoionisation processes in low-density gases with a subdiffraction spatial resolution and can be used as well in profile measurements for sharply focused, intense laser beams. In a demonstration experiment, a femtosecond laser beam with a peak intensity of ~1014 W cm-2 was focused to a 40-μm-diameter waist in vacuum near a millimetre-size tip and ~2-μm spatial resolution was achieved. According to our estimates, the use of a sharper tip will ensure a submicron spatial resolution, which is a crucial condition for the spatial diagnostics of sharply focused short-wavelength VUV radiation and X-rays.
Keywords:
laser ionisation of atoms and molecules, ion projection microscopy.
Received: 24.12.2012 Revised: 24.01.2013
Citation:
S. A. Aseev, B. N. Mironov, V. G. Minogin, A. P. Cherkun, S. V. Chekalin, “Microscopy of photoionisation processes”, Kvantovaya Elektronika, 43:4 (2013), 308–312 [Quantum Electron., 43:4 (2013), 308–312]
Linking options:
https://www.mathnet.ru/eng/qe15107 https://www.mathnet.ru/eng/qe/v43/i4/p308
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