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Kvantovaya Elektronika, 2011, Volume 41, Number 7, Pages 663–668 (Mi qe14523)  

This article is cited in 15 scientific papers (total in 15 papers)

Laser applications

Combined elemental and microstructural analysis of genuine and fake copper-alloy coins

L. Bartoli, J. Agresti, M. Mascalchi, A. Mencaglia, I. Cacciari, S. Siano

Istituto di Fisica Applicata "N. Carrara", IFAC-CNR, Sesto Fiorentino (FI), Italy
References:
Abstract: Innovative noninvasive material analysis techniques are applied to determine archaeometallurgical characteristics of copper-alloy coins from Florence's National Museum of Archaeology. Three supposedly authentic Roman coins and three hypothetically fraudolent imitations are thoroughly investigated using laser-induced plasma spectroscopy and time of flight neutron diffraction along with 3D videomicroscopy and electron microscopy. Material analyses are aimed at collecting data allowing for objective discrimination between genuine Roman productions and late fakes. The results show the mentioned techniques provide quantitative compositional and textural data, which are strictly related to the manufacturing processes and aging of copper alloys.
Received: 26.11.2010
English version:
Quantum Electronics, 2011, Volume 41, Issue 7, Pages 663–668
DOI: https://doi.org/10.1070/QE2011v041n07ABEH014523
Bibliographic databases:
Document Type: Article
PACS: 42.62.-b, 61.80.Ba, 61.05.fm
Language: Russian


Citation: L. Bartoli, J. Agresti, M. Mascalchi, A. Mencaglia, I. Cacciari, S. Siano, “Combined elemental and microstructural analysis of genuine and fake copper-alloy coins”, Kvantovaya Elektronika, 41:7 (2011), 663–668 [Quantum Electron., 41:7 (2011), 663–668]
Linking options:
  • https://www.mathnet.ru/eng/qe14523
  • https://www.mathnet.ru/eng/qe/v41/i7/p663
  • This publication is cited in the following 15 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    Квантовая электроника Quantum Electronics
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    References:38
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