Yu. V. Larionov, V. O. Sokolov, V. G. Plotnichenko, “Rearrangement of a phosphosilicate glass network induced by the 193-nm radiation”, Kvantovaya Elektronika, 38:10 (2008), 945–950 [Quantum Electron., 38:10 (2008), 945

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Kvantovaya Elektronika, 2008, Volume 38, Number 10, Pages 945–950 (Mi qe13769)

This article is cited in 2 scientific papers (total in 2 papers)

Interaction of laser radiation with matter

Rearrangement of a phosphosilicate glass network induced by the 193-nm radiation

Yu. V. Larionov^a, V. O. Sokolov^b, V. G. Plotnichenko^b

^a Prokhorov General Physics Institute of the Russian Academy of Sciences, Moscow
^b Fiber Optics Research Center of the Russian Academy of Sciences, Moscow

Full-text PDF (151 kB) Citations (2)

Abstract: The IR absorption and Raman spectra of phosphosilicate glass (PSG) are measured during its exposure to radiation at a wavelength of 193 nm. The obtained data demonstrate the complicated rearrangement dynamics of the glass network around phosphor atoms and of the glass network as a whole. The experimental dependences are explained by the model of the PSG network based on the concepts of the theory of rigidity percolation.

Received: 27.11.2007
Revised: 19.03.2008

English version:
Quantum Electronics, 2008, Volume 38, Issue 10, Pages 945–950
DOI: https://doi.org/10.1070/QE2008v038n10ABEH013769

Bibliographic databases:

Document Type: Article

PACS: 42.70.Ce, 42.70.Nq, 42.81.-i

Language: Russian

Citation: Yu. V. Larionov, V. O. Sokolov, V. G. Plotnichenko, “Rearrangement of a phosphosilicate glass network induced by the 193-nm radiation”, Kvantovaya Elektronika, 38:10 (2008), 945–950 [Quantum Electron., 38:10 (2008), 945–950]

Linking options:

https://www.mathnet.ru/eng/qe13769

https://www.mathnet.ru/eng/qe/v38/i10/p945

This publication is cited in the following 2 articles:

Citing articles in Google Scholar: Russian citations, English citations
Related articles in Google Scholar: Russian articles, English articles

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