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Kvantovaya Elektronika, 2007, Volume 37, Number 6, Pages 575–579 (Mi qe13485)  

This article is cited in 3 scientific papers (total in 3 papers)

Fiber and integrated optics

Defects of a phosphosilicate glass exposed to the 193-nm radiation

Yu. V. Larionov, V. O. Sokolov, V. G. Plotnichenko

Fiber Optics Research Center of the Russian Academy of Sciences, Moscow
Full-text PDF (131 kB) Citations (3)
Abstract: Induced absorption is measured in a hydrogen-unloaded phosphosilicate glass (PSG) in spectral ranges from 140 to 850 nm and from 1000 to 1700 nm before and after its exposure to the 193-nm radiation. It is shown that the induced-absorption bands in the range between 140 and 300 nm do not coincide with the bands observed earlier after exposing a PSG to X-rays. It is assumed that the photorefractive effect in the PSG is related to variations induced in the glass network rather than to defects responsible for the induced-absorption bands.
Received: 22.10.2006
English version:
Quantum Electronics, 2007, Volume 37, Issue 6, Pages 575–579
DOI: https://doi.org/10.1070/QE2007v037n06ABEH013485
Bibliographic databases:
Document Type: Article
PACS: 42.81.Cn, 79.20.Ds, 61.80.Ba
Language: Russian


Citation: Yu. V. Larionov, V. O. Sokolov, V. G. Plotnichenko, “Defects of a phosphosilicate glass exposed to the 193-nm radiation”, Kvantovaya Elektronika, 37:6 (2007), 575–579 [Quantum Electron., 37:6 (2007), 575–579]
Linking options:
  • https://www.mathnet.ru/eng/qe13485
  • https://www.mathnet.ru/eng/qe/v37/i6/p575
  • This publication is cited in the following 3 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
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