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This article is cited in 3 scientific papers (total in 3 papers)
Fiber and integrated optics
Defects of a phosphosilicate glass exposed to the 193-nm radiation
Yu. V. Larionov, V. O. Sokolov, V. G. Plotnichenko Fiber Optics Research Center of the Russian Academy of Sciences, Moscow
Abstract:
Induced absorption is measured in a hydrogen-unloaded phosphosilicate glass (PSG) in spectral ranges from 140 to 850 nm and from 1000 to 1700 nm before and after its exposure to the 193-nm radiation. It is shown that the induced-absorption bands in the range between 140 and 300 nm do not coincide with the bands observed earlier after exposing a PSG to X-rays. It is assumed that the photorefractive effect in the PSG is related to variations induced in the glass network rather than to defects responsible for the induced-absorption bands.
Received: 22.10.2006
Citation:
Yu. V. Larionov, V. O. Sokolov, V. G. Plotnichenko, “Defects of a phosphosilicate glass exposed to the 193-nm radiation”, Kvantovaya Elektronika, 37:6 (2007), 575–579 [Quantum Electron., 37:6 (2007), 575–579]
Linking options:
https://www.mathnet.ru/eng/qe13485 https://www.mathnet.ru/eng/qe/v37/i6/p575
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