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International conference on semiconductor injection lasers SELCO-87
Calculation of the yield of fault-free laser diodes from the characteristics of the (100)InP substrate material used in epitaxial double heterostructures
A. Baerwolff, P. Ènders, A. Knauer, D. Linke, U. Zeimer
Abstract:
It is shown that the yield of fault-free laser diodes is related to the density and distribution of dislocations in the substrate. A method is described for visualization of etch pits and of their relationship to defects in the substrate.
Citation:
A. Baerwolff, P. Ènders, A. Knauer, D. Linke, U. Zeimer, “Calculation of the yield of fault-free laser diodes from the characteristics of the (100)InP substrate material used in epitaxial double heterostructures”, Kvantovaya Elektronika, 15:11 (1988), 2273–2275 [Sov J Quantum Electron, 18:11 (1988), 1422–1424]
Linking options:
https://www.mathnet.ru/eng/qe12633 https://www.mathnet.ru/eng/qe/v15/i11/p2273
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Statistics & downloads: |
Abstract page: | 179 | Full-text PDF : | 85 | First page: | 1 |
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