Kvantovaya Elektronika
RUS  ENG    JOURNALS   PEOPLE   ORGANISATIONS   CONFERENCES   SEMINARS   VIDEO LIBRARY   PACKAGE AMSBIB  
General information
Latest issue
Archive
Impact factor
Submit a manuscript

Search papers
Search references

RSS
Latest issue
Current issues
Archive issues
What is RSS



Kvantovaya Elektronika:
Year:
Volume:
Issue:
Page:
Find






Personal entry:
Login:
Password:
Save password
Enter
Forgotten password?
Register


Kvantovaya Elektronika, 1988, Volume 15, Number 11, Pages 2273–2275 (Mi qe12633)  

International conference on semiconductor injection lasers SELCO-87

Calculation of the yield of fault-free laser diodes from the characteristics of the (100)InP substrate material used in epitaxial double heterostructures

A. Baerwolff, P. Ènders, A. Knauer, D. Linke, U. Zeimer
Abstract: It is shown that the yield of fault-free laser diodes is related to the density and distribution of dislocations in the substrate. A method is described for visualization of etch pits and of their relationship to defects in the substrate.
English version:
Soviet Journal of Quantum Electronics, 1988, Volume 18, Issue 11, Pages 1422–1424
DOI: https://doi.org/10.1070/QE1988v018n11ABEH012633
Bibliographic databases:
Document Type: Article
UDC: 621.373.826.038.825.4
PACS: 42.55.Px, 73.40.Kp, 61.72.Lk
Language: Russian


Citation: A. Baerwolff, P. Ènders, A. Knauer, D. Linke, U. Zeimer, “Calculation of the yield of fault-free laser diodes from the characteristics of the (100)InP substrate material used in epitaxial double heterostructures”, Kvantovaya Elektronika, 15:11 (1988), 2273–2275 [Sov J Quantum Electron, 18:11 (1988), 1422–1424]
Linking options:
  • https://www.mathnet.ru/eng/qe12633
  • https://www.mathnet.ru/eng/qe/v15/i11/p2273
  • Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    Квантовая электроника Quantum Electronics
    Statistics & downloads:
    Abstract page:179
    Full-text PDF :85
    First page:1
     
      Contact us:
     Terms of Use  Registration to the website  Logotypes © Steklov Mathematical Institute RAS, 2024