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Kvantovaya Elektronika, 1975, Volume 2, Number 10, Pages 2223–2230 (Mi qe12017)  

Use of UF-R and UF-VR photographic plates in laser plasma diagnostics based on continuous x-ray radiation in 0.1–1 nm spectral range

A. A. Kologrivov, Yu. A. Mikhailov, G. V. Sklizkov, S. I. Fedotov, A. S. Shikanov, M. R. Shpol'skii
Abstract: The results are given of an experimental investigation of a possible use of UF-R and UF-VR photographic films for diagnostics of a high-temperature plasma formed as a result of focusing of 1.06 μ laser radiation on the surface of a flat bulk Al target. These films were used to record continuous x-ray radiation in the 0.1–1 nm range. An analysis was made of the method of multichannel detection of x-ray radiation by photographic films. The method was applied to the measurement of the electron temperature of a plasma generated by laser radiation of 1013–1015 W/cm2 power density. The absolute and relative sensitivities of the UF-R and UF-VR photographic films to x-ray radiation were determined experimentally.
Received: 17.04.1975
English version:
Soviet Journal of Quantum Electronics, 1975, Volume 5, Issue 10, Pages 1210–1214
DOI: https://doi.org/10.1070/QE1975v005n10ABEH012017
Document Type: Article
UDC: 621.039.66:621.375.826+771.531.31:778.33
PACS: 07.50.E
Language: Russian


Citation: A. A. Kologrivov, Yu. A. Mikhailov, G. V. Sklizkov, S. I. Fedotov, A. S. Shikanov, M. R. Shpol'skii, “Use of UF-R and UF-VR photographic plates in laser plasma diagnostics based on continuous x-ray radiation in 0.1–1 nm spectral range”, Kvantovaya Elektronika, 2:10 (1975), 2223–2230 [Sov J Quantum Electron, 5:10 (1975), 1210–1214]
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    Квантовая электроника Quantum Electronics
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