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This article is cited in 5 scientific papers (total in 5 papers)
Brief Communications
Measure of surface defectiveness and optical strength of transparent dielectrics
A. S. Bebchuk, D. A. Gromov, V. S. Nechitaĭlo
Abstract:
Absorbing inclusions were introduced deliberately in a study of the influence of surface defects in transparent dielectrics on their optical strength. It was found that the surface strength was governed mainly not by its relief but by the presence of a defective surface layer. It was established that the measure of surface defectiveness, defined as the ratio of the bulk to the surface strength, was less than unity for plastic materials and more than unity for brittle materials.
Received: 19.12.1975
Citation:
A. S. Bebchuk, D. A. Gromov, V. S. Nechitaĭlo, “Measure of surface defectiveness and optical strength of transparent dielectrics”, Kvantovaya Elektronika, 3:8 (1976), 1814–1816 [Sov J Quantum Electron, 6:8 (1976), 986–987]
Linking options:
https://www.mathnet.ru/eng/qe11804 https://www.mathnet.ru/eng/qe/v3/i8/p1814
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