Kvantovaya Elektronika
RUS  ENG    JOURNALS   PEOPLE   ORGANISATIONS   CONFERENCES   SEMINARS   VIDEO LIBRARY   PACKAGE AMSBIB  
General information
Latest issue
Archive
Impact factor
Submit a manuscript

Search papers
Search references

RSS
Latest issue
Current issues
Archive issues
What is RSS



Kvantovaya Elektronika:
Year:
Volume:
Issue:
Page:
Find






Personal entry:
Login:
Password:
Save password
Enter
Forgotten password?
Register


Kvantovaya Elektronika, 1976, Volume 3, Number 8, Pages 1814–1816 (Mi qe11804)  

This article is cited in 5 scientific papers (total in 5 papers)

Brief Communications

Measure of surface defectiveness and optical strength of transparent dielectrics

A. S. Bebchuk, D. A. Gromov, V. S. Nechitaĭlo
Full-text PDF (855 kB) Citations (5)
Abstract: Absorbing inclusions were introduced deliberately in a study of the influence of surface defects in transparent dielectrics on their optical strength. It was found that the surface strength was governed mainly not by its relief but by the presence of a defective surface layer. It was established that the measure of surface defectiveness, defined as the ratio of the bulk to the surface strength, was less than unity for plastic materials and more than unity for brittle materials.
Received: 19.12.1975
English version:
Soviet Journal of Quantum Electronics, 1976, Volume 6, Issue 8, Pages 986–987
DOI: https://doi.org/10.1070/QE1976v006n08ABEH011804
Document Type: Article
UDC: 621.378.32:539.2
PACS: 77.90.+k, 78.50.-w
Language: Russian


Citation: A. S. Bebchuk, D. A. Gromov, V. S. Nechitaĭlo, “Measure of surface defectiveness and optical strength of transparent dielectrics”, Kvantovaya Elektronika, 3:8 (1976), 1814–1816 [Sov J Quantum Electron, 6:8 (1976), 986–987]
Linking options:
  • https://www.mathnet.ru/eng/qe11804
  • https://www.mathnet.ru/eng/qe/v3/i8/p1814
  • This publication is cited in the following 5 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    Квантовая электроника Quantum Electronics
    Statistics & downloads:
    Abstract page:116
    Full-text PDF :108
     
      Contact us:
     Terms of Use  Registration to the website  Logotypes © Steklov Mathematical Institute RAS, 2024