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Kvantovaya Elektronika, 1976, Volume 3, Number 8, Pages 1814–1816 (Mi qe11804)  

This article is cited in 5 scientific papers (total in 5 papers)

Brief Communications

Measure of surface defectiveness and optical strength of transparent dielectrics

A. S. Bebchuk, D. A. Gromov, V. S. Nechitaĭlo
Full-text PDF (855 kB) Citations (5)
Abstract: Absorbing inclusions were introduced deliberately in a study of the influence of surface defects in transparent dielectrics on their optical strength. It was found that the surface strength was governed mainly not by its relief but by the presence of a defective surface layer. It was established that the measure of surface defectiveness, defined as the ratio of the bulk to the surface strength, was less than unity for plastic materials and more than unity for brittle materials.
Received: 19.12.1975
English version:
Soviet Journal of Quantum Electronics, 1976, Volume 6, Issue 8, Pages 986–987
DOI: https://doi.org/10.1070/QE1976v006n08ABEH011804
Document Type: Article
UDC: 621.378.32:539.2
PACS: 77.90.+k, 78.50.-w
Language: Russian


Citation: A. S. Bebchuk, D. A. Gromov, V. S. Nechitaĭlo, “Measure of surface defectiveness and optical strength of transparent dielectrics”, Kvantovaya Elektronika, 3:8 (1976), 1814–1816 [Sov J Quantum Electron, 6:8 (1976), 986–987]
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  • https://www.mathnet.ru/eng/qe/v3/i8/p1814
  • This publication is cited in the following 5 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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