|
This article is cited in 4 scientific papers (total in 4 papers)
Brief Communications
Reconstruction of the refractive index profile in diffused waveguides
O. Parriaux, V. A. Sychugov, A. V. Tishchenko P. N. Lebedev Physical Institute, the USSR Academy of Sciences, Moscow
Abstract:
A simple method is proposed for measuring the refractive index $n(x)$ at the surface of a diffused waveguide whereby the profile $n(x)$ can be reconstructed uniquely from the mode spectrum of the waveguide. A description is given of a method of measuring effective refractive indices of the waveguide modes using a grating element for coupling radiation into the waveguide. The profile $n(x)$ in single-mode waveguides is discussed.
Received: 08.05.1980
Citation:
O. Parriaux, V. A. Sychugov, A. V. Tishchenko, “Reconstruction of the refractive index profile in diffused waveguides”, Kvantovaya Elektronika, 7:9 (1980), 2028–2031 [Sov J Quantum Electron, 10:9 (1980), 1175–1177]
Linking options:
https://www.mathnet.ru/eng/qe10708 https://www.mathnet.ru/eng/qe/v7/i9/p2028
|
Statistics & downloads: |
Abstract page: | 222 | Full-text PDF : | 78 |
|