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Kvantovaya Elektronika, 1978, Volume 5, Number 6, Pages 1396–1398 (Mi qe10417)  
Brief Communications

Controlled transparency based on frustrated total internal reflection of light

S. Kh. Sŭĭnov, V. Kh. Sŭĭnov, L. K. Komitov
Full-text PDF (534 kB)
Abstract: An experimental study was made of a controlled transparency based on frustrated total internal reflection. The contrast was measured for different values of the applied voltage. The maximum value of the contrast was 36 000:1 for a voltage of 120 V.
Received: 08.01.1978
English version:
Soviet Journal of Quantum Electronics, 1978, Volume 8, Issue 6, Pages 805–806
DOI: https://doi.org/10.1070/QE1978v008n06ABEH010417
Document Type: Article
UDC: 621.396.535.8
PACS: 42.30.Nt
Language: Russian


Citation: S. Kh. Sŭĭnov, V. Kh. Sŭĭnov, L. K. Komitov, “Controlled transparency based on frustrated total internal reflection of light”, Kvantovaya Elektronika, 5:6 (1978), 1396–1398 [Sov J Quantum Electron, 8:6 (1978), 805–806]
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    		Квантовая электроника Quantum Electronics
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