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This article is cited in 2 scientific papers (total in 2 papers)
Experimental determination of the effective thickness of diffused waveguides
N. M. Lyndin, A. M. Prokhorov, A. A. Spikhal'skiĭ, V. A. Sychugov, A. V. Tishchenko, G. P. Shipulo
Abstract:
A description is given of a simple method for determining the effective thickness of diffused waveguides with an arbitrary refractive index distribution n (x). The measured effective waveguide thickness is governed by the mode field at the boundary. Experimental determinations of the effective thickness are reported for waveguides in glass formed by the diffusion of Ag+ and the various methods for finding the effective thickness of diffused waveguides are compared.
Received: 05.07.1977
Citation:
N. M. Lyndin, A. M. Prokhorov, A. A. Spikhal'skiĭ, V. A. Sychugov, A. V. Tishchenko, G. P. Shipulo, “Experimental determination of the effective thickness of diffused waveguides”, Kvantovaya Elektronika, 5:6 (1978), 1323–1328 [Sov J Quantum Electron, 8:6 (1978), 754–757]
Linking options:
https://www.mathnet.ru/eng/qe10392 https://www.mathnet.ru/eng/qe/v5/i6/p1323
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Abstract page: | 104 | Full-text PDF : | 67 |
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