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This article is cited in 2 scientific papers (total in 2 papers)
Diffraction method for measuring the refractive index on the surface of a material
A. A. Zlenko, V. N. Sorokovikov, V. A. Sychugov, G. P. Shipulo
Abstract:
A method for the determination of the refractive index of the surface layer of a matenal, about 5.0–10.0 nm thick, was developed and tested experimentally. The method was used to find the refractive index profile of thin-film waveguides prepared by diffusion in glass.
Received: 05.07.1977
Citation:
A. A. Zlenko, V. N. Sorokovikov, V. A. Sychugov, G. P. Shipulo, “Diffraction method for measuring the refractive index on the surface of a material”, Kvantovaya Elektronika, 5:6 (1978), 1318–1322 [Sov J Quantum Electron, 8:6 (1978), 751–754]
Linking options:
https://www.mathnet.ru/eng/qe10391 https://www.mathnet.ru/eng/qe/v5/i6/p1318
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| Abstract page: | 168 | | Full-text PDF : | 106 |
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