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Kvantovaya Elektronika, 1980, Volume 7, Number 11, Pages 2362–2366 (Mi qe10315)  
Influence of changes in the waveguide thickness on the efficiency of Bragg diffraction of radiation by grating structures

Yu. A. Bykovskiĭ, V. L. Smirnov, V. N. Sorokovnikov

Moscow Engineering Physics Institute
Full-text PDF (787 kB)
Abstract: A study is made of the influence of the waveguide thickness on the Bragg diffraction efficiency and the possibility of utilizing this effect to develop highly sensitive detectors for small displacements and strain gauges is examined. It is shown that if the waveguide thickness deviates by 1.8 nm from its initial value of 1.1$\mu m$, this causes $10\%$ modulation of the radiation.
Received: 12.03.1980
English version:
Soviet Journal of Quantum Electronics, 1980, Volume 10, Issue 11, Pages 1376–1378
DOI: https://doi.org/10.1070/QE1980v010n11ABEH010315
Bibliographic databases:
UDC: 621.373.826:621.396
PACS: 42.80.Lt, 07.10.+i
Language: Russian
Citation: Yu. A. Bykovskiǐ, V. L. Smirnov, V. N. Sorokovnikov, “Influence of changes in the waveguide thickness on the efficiency of Bragg diffraction of radiation by grating structures”, Kvantovaya Elektronika, 7:11 (1980), 2362–2366 [Sov J Quantum Electron, 10:11 (1980), 1376–1378]
Citation in format AMSBIB
\Bibitem{BykSmiSor80}
\by Yu.~A.~Bykovski{\v\i}, V.~L.~Smirnov, V.~N.~Sorokovnikov
\paper Influence of changes in the waveguide thickness on the efficiency of Bragg diffraction of radiation by grating structures
\jour Kvantovaya Elektronika
\yr 1980
\vol 7
\issue 11
\pages 2362--2366
\mathnet{http://mi.mathnet.ru/qe10315}
\transl
\jour Sov J Quantum Electron
\yr 1980
\vol 10
\issue 11
\pages 1376--1378
\crossref{https://doi.org/10.1070/QE1980v010n11ABEH010315}
\isi{https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=Publons&SrcAuth=Publons_CEL&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=A1980KW87400011}
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    		Квантовая электроника Quantum Electronics
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