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Brief Communications
Influence of transition layers on the dispersion characteristics of film optical waveguides prepared by the method of reactive cathodic sputtering
V. I. Anikin, A. P. Gorobets, S. S. Olevskii, A. N. Polovinkin Peoples Friendship University of Russia
Abstract:
A transition layer was found between a film and its substrate in planar optical waveguides prepared by the method of reactive cathodic sputtering. The depth and profile of this layer were determined. A spectrum of the effective refractive indices found experimentally did not agree with a spectrum predicted by the theory of thin-film waveguides. Dispersion equations were derived to allow for the presence of a transition layer and they predicted a spectrum of the effective refractive indices which agreed with the experimental results.
Received: 12.05.1980
Citation:
V. I. Anikin, A. P. Gorobets, S. S. Olevskii, A. N. Polovinkin, “Influence of transition layers on the dispersion characteristics of film optical waveguides prepared by the method of reactive cathodic sputtering”, Kvantovaya Elektronika, 7:12 (1980), 2631–2634 [Sov J Quantum Electron, 10:12 (1980), 1537–1539]
Linking options:
https://www.mathnet.ru/eng/qe10251 https://www.mathnet.ru/eng/qe/v7/i12/p2631
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