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Kvantovaya Elektronika, 1980, Volume 7, Number 3, Pages 641–643 (Mi qe10009)  
Brief Communications

Total-internal-reflection holograms recorded in thin $As_2S_3$ films

S. Siinov, R. Stoicheva, P. Markovski
Full-text PDF (560 kB)
Abstract: A study was made of holograms recorded with a reference wave which experienced total internal reflection at the interface between the recording medium and air. The characteristics of the polarization dependence of the intensity of the reconstructed wave were investigated as a function of the polarization angle in the recording and reconstruction stages, and also as a function of the thickness of the recording medium ($As_2S_3$ film).
Received: 11.09.1979
English version:
Soviet Journal of Quantum Electronics, 1980, Volume 10, Issue 3, Pages 366–367
DOI: https://doi.org/10.1070/QE1980v010n03ABEH010009
Bibliographic databases:
Document Type: Article
UDC: 778.38
PACS: 42.40.Ht
Language: Russian
Citation: S. Siinov, R. Stoicheva, P. Markovski, “Total-internal-reflection holograms recorded in thin $As_2S_3$ films”, Kvantovaya Elektronika, 7:3 (1980), 641–643 [Sov J Quantum Electron, 10:3 (1980), 366–367]
Citation in format AMSBIB
\Bibitem{SiiStoMar80}
\by S.~Siinov, R.~Stoicheva, P.~Markovski
\paper Total-internal-reflection holograms recorded in thin $As_2S_3$ films
\jour Kvantovaya Elektronika
\yr 1980
\vol 7
\issue 3
\pages 641--643
\mathnet{http://mi.mathnet.ru/qe10009}
\transl
\jour Sov J Quantum Electron
\yr 1980
\vol 10
\issue 3
\pages 366--367
\crossref{https://doi.org/10.1070/QE1980v010n03ABEH010009}
\isi{https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=Publons&SrcAuth=Publons_CEL&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=A1980JP22400031}
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  • https://www.mathnet.ru/eng/qe/v7/i3/p641
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    		Квантовая электроника Quantum Electronics
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