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Prikladnaya Mekhanika i Tekhnicheskaya Fizika, 1966, Volume 7, Issue 2, Pages 87–88 (Mi pmtf8518)  
Observation of stability loss of the surface layer of a bent crystal by reflection x-ray microscopy techniques

I. B. Staryi, A. A. Khanonkin

Odessa
Full-text PDF (385 kB)
Received: 30.09.1965
English version:
Journal of Applied Mechanics and Technical Physics, 1966, Volume 7, Issue 2, Pages 57–58
DOI: https://doi.org/10.1007/BF00916975
Document Type: Article
Language: Russian
Citation: I. B. Staryi, A. A. Khanonkin, “Observation of stability loss of the surface layer of a bent crystal by reflection x-ray microscopy techniques”, Prikl. Mekh. Tekh. Fiz., 7:2 (1966), 87–88; J. Appl. Mech. Tech. Phys., 7:2 (1966), 57–58
Citation in format AMSBIB
\Bibitem{StaKha66}
\by I.~B.~Staryi, A.~A.~Khanonkin
\paper Observation of stability loss of the surface layer of a bent crystal by reflection x-ray microscopy techniques
\jour Prikl. Mekh. Tekh. Fiz.
\yr 1966
\vol 7
\issue 2
\pages 87--88
\mathnet{http://mi.mathnet.ru/pmtf8518}
\transl
\jour J. Appl. Mech. Tech. Phys.
\yr 1966
\vol 7
\issue 2
\pages 57--58
\crossref{https://doi.org/10.1007/BF00916975}
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