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Prikladnaya Mekhanika i Tekhnicheskaya Fizika, 2009, Volume 50, Issue 1, Pages 118–127
(Mi pmtf1702)
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This article is cited in 2 scientific papers (total in 2 papers)
Stress state in the vicinity of an inclined elliptical defect and stress intensity factors for biaxial loading of a plate
A. A. Ostsemina, P. B. Utkinb a South Ural Research-and-Production Center, Chelyabinsk, 450019, Russia
b South Ural State University, Chelyabinsk, 454080, Russia
Abstract:
The problem of determining the stress state of a plate with an inclined elliptical notch under biaxial loading is considered. The
Kolosov–Muskhelishvili method is used to obtain an expression for the stress near the vertex of an inclined ellipse, whose particular case are expressions for the stress in the case of an inclined crack. The stress intensity factors $K_{\mathrm{I}}$ and $K_{\mathrm{II}}$ were determined experimentally by holographic interferometry in the case of extension of a plate with an inclined crack-like defect. The calculation results are compared with experimental data.
Keywords:
fracture mechanics, stress intensity factors, Kolosov–Muskhelishvili method, stress state, plate with an inclined elliptical notch, holographic interferometry.
Received: 21.09.2007 Accepted: 11.06.2008
Citation:
A. A. Ostsemin, P. B. Utkin, “Stress state in the vicinity of an inclined elliptical defect and stress intensity factors for biaxial loading of a plate”, Prikl. Mekh. Tekh. Fiz., 50:1 (2009), 118–127; J. Appl. Mech. Tech. Phys., 50:1 (2009), 99–106
Linking options:
https://www.mathnet.ru/eng/pmtf1702 https://www.mathnet.ru/eng/pmtf/v50/i1/p118
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